Wave-equation reflection tomography: Annihilators and sensitivity kernels

Geophysical Journal International

Volumn 167, Issue 3, 2006, Pages 1332-1352

  de Hoop, Maarten V ^a   van der Hilst, Robert D ^b   Shen, Peng ^c  

^a PURDUE UNIVERSITY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c TOTAL   (France)

Author keywords

Migration velocity analysis; Reflection tomography; Sensitivity kernels

Indexed keywords

OPTIMIZATION; SEISMIC TOMOGRAPHY; SENSITIVITY ANALYSIS; WAVE EQUATION; WAVE FIELD; WAVE PROPAGATION; WAVE REFLECTION; WAVE SCATTERING;

EID: 33845321737     PISSN: 0956540X     EISSN: 1365246X     Source Type: Journal    
DOI: 10.1111/j.1365-246X.2006.03132.x     Document Type: Article

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