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Volumn 89, Issue 14, 2002, Pages
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STM Imaging of Flux Line Arrangements in the Peak Effect Regime
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
MAGNETIC FIELD EFFECTS;
MAGNETIC VARIABLES MEASUREMENT;
MAGNETIZATION;
NUMERICAL METHODS;
PHASE DIAGRAMS;
PHASE TRANSITIONS;
SCANNING TUNNELING MICROSCOPY;
TEMPERATURE;
FLUX LINE ARRANGEMENT;
MAGNETIZATION MEASUREMENT;
PEAK EFFECT REGIME;
PINNING ENERGY;
NIOBIUM COMPOUNDS;
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EID: 33845302903
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.89.147006 Document Type: Article |
Times cited : (72)
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References (18)
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