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Volumn 89, Issue 14, 2002, Pages

STM Imaging of Flux Line Arrangements in the Peak Effect Regime

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); MAGNETIC FIELD EFFECTS; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; NUMERICAL METHODS; PHASE DIAGRAMS; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; TEMPERATURE;

EID: 33845302903     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.147006     Document Type: Article
Times cited : (72)

References (18)
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    • E.M. Forgan et al, Phys. Rev. Lett.10.1103/PhysRevLett.88.167003 88, 167003 (2002).
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    • Forgan, E.M.1
  • 11
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    • (1997) Phys. Rev. B , vol.56 , pp. 3425
    • Angurel, L.A.1
  • 18
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    • A.I. Larkin and Yu.N. Ovchinnikov, J. Low Temp. Phys. 34, 409 (1979).
    • (1979) J. Low Temp. Phys. , vol.34 , pp. 409


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.