The influence of doping element on structural and luminescent characteristics of ZnS thin films

Superlattices and Microstructures

Volumn 40, Issue 4-6 SPEC. ISS., 2006, Pages 651-656

  Kryshtab, T ^a   Khomchenko, V S ^b   Andraca Adame, J A ^a   Rodionov, V E ^b   Khachatryan, V B ^b   Tzyrkunov, Yu A ^b  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

Atomic force microscopy; Crystal structure; Doping element; Photoluminescence; Thin film; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DOPING (ADDITIVES); HEAT TREATMENT; PHOTOLUMINESCENCE; X RAY DIFFRACTION; ZINC SULFIDE;

DOPANTS; DOPING ELEMENTS; PHOTOLUMINESCENT (PL) SPECTRA;

THIN FILMS;

EID: 33845294429     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2006.09.001     Document Type: Article

References (9)

1. Brady G.S. Materials Handbook (1971), McGraw-Hill Book Co., New York p. 870
2. Boudghene Stambouli A., Hamzaoui S., and Bouderbala M. Thin Solid Films 283 (1996) 204
3. L.J. Berezhinsky, V.S. Khomchenko, V.E. Rodionov, Yu.A. Tzyrkunov, Extended Abstracts of the 5th International Conference on the Science and Technology of Display Phosphors, San Diego, CA, 1999, p. 93
4. Ono Y.A. Electroluminescent Displays (1995), World Scientific Publ. Co., London p. 170
5. Zhanorsky L.F., Zavyalova L.V., and Svechnikov G.S. Thin Solid Films 128 (1985) 241
6. V.S. Khomchenko, V.E. Rodionov, Yu.A. Tzyrkunov, Proceedings of the 7th Int. Symposium Advanced Display Technologies, Minsk, Byelorussia, 1998, p. 218
7. Kina H., Yamada Y., Maruta Y., and Tamura Y. J. Cryst. Growth 169 (1996) 33
8. Minagawa T. J. Phys. Soc. Jpn. 49 (1980) 285
9. Arterton A., Brightwell J.W., Mason S., Ray B., and Viney I.V.F. J. Cryst. Growth 117 (1992) 1008