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4
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85023334700
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GAUSSIAN 82
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Binkley, J. S.; Frisch, M.; Krishnan, R.; DeFrees, D.; Schlegel, H. B.; Whiteside, R. A.; Fluder, E.; Seeger, R.; Peope, J. A. GAUSSIAN 82, Carnegie-Mellon University, Pittsburgh, PA.
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Carnegie-Mellon University, Pittsburgh, PA.
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Binkley, J.S.1
Frisch, M.2
Krishnan, R.3
DeFrees, D.4
Schlegel, H.B.5
Whiteside, R.A.6
Fluder, E.7
Seeger, R.8
Peope, J.A.9
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5
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3643130569
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Professor Schowen has informed us that the C2h structure does indeed have a second imaginary frequency of 25 cm'1 and that the 3-21G surface is very flat in the region of this stationary point.
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Huttley, B. G.; Mountain, A. E.; Williams, 1. H.; Maggiora, G. M.; Schowen, R. J. J. Chem. Soc., Chem. Commun. 1986. 267. Professor Schowen has informed us that the C2h structure does indeed have a second imaginary frequency of 25 cm'1 and that the 3-21G surface is very flat in the region of this stationary point.
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(1986)
J. Chem. Soc., Chem. Commun.
, pp. 267
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Huttley, B.G.1
Mountain, A.E.2
Williams, H.3
Maggiora, G.M.4
Schowen, R.J.5
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6
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84981621734
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Van der Kerk, S. M.; Van Gerresheim, W., Verhoeven, J. W. Red. Trav. Chim. Pavs-Bas 1984, 103, 143.
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(1984)
Red. Trav. Chim. Pavs-Bas
, vol.103
, pp. 143
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der Kerk, S.M.1
Gerresheim, W.2
Verhoeven, J.W.3
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7
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0000033904
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Verhoeven, J. W.; Van Gerresheim, W. O.; Martens, F. M.; van der Kerk, S. M. Tetrahedron 1986, 42, 975.
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(1986)
Tetrahedron
, vol.42
, pp. 975
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Verhoeven, J.W.1
Gerresheim, W.O.2
Martens, F.M.3
der Kerk, S.M.4
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9
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0000671595
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Ohno, A.; Ikegushi, M.; Kimura, T.; Oka, S. J. am. Chem. Soc. 1979, 101, 7036.
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(1979)
J. am. Chem. Soc.
, vol.101
, pp. 7036
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Ohno, A.1
Ikegushi, M.2
Kimura, T.3
Oka, S.4
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11
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0000100515
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de Kok, P. M. T.; Donkersloot, M. C. A.; van Lieu, P. M.; Meulen-dijks, G. H. W. M.; Bastiaansen, L. A. M.; Van Hooff, H. J. G.; Kanters, J. A.; Buck, H. M. Tetrahedron 1986, 42. 941.
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(1986)
Tetrahedron
, vol.42
, pp. 941
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de Kok, P.M.T.1
Donkersloot, M.C.A.2
Lieu, P.M.3
Meulen-dijks, G.H.W.M.4
Bastiaansen, L.A.M.5
Hooff, H.J.G.6
Kanters, J.A.7
Buck, H.M.8
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13
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0000773265
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Nambiar. K.: Stauffer, D. M.; Kolodziej, P. A.; Benner, S. A. J. Am. Chem. Soc. 1983. 105, 5886. Benner, S. A. Experientia 1982, 38, 633.
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Benner, S. A.; Nambiar, K. P.; Chambers, G. K. J. K. J. Am. Chem. Soc. 1985, 107, 5513. Nambiar. K.: Stauffer, D. M.; Kolodziej, P. A.; Benner, S. A. J. Am. Chem. Soc. 1983. 105, 5886. Benner, S. A. Experientia 1982, 38, 633.
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J. Am. Chem. Soc.
, vol.107
, pp. 5513
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Benner, S.A.1
Nambiar, K.P.2
Chambers, G.K.J.K.3
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14
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0023043811
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and references therein.
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Houk. K. N.; Paddon-Row, M. N.; Rondan, N. G.; Wu, Y. D.; Brown, F. K.; Spellmeyer, D. C.; Metz, J. T.; Li, Y. Loncharich, R. J. Science (Washington, D. C.) 1986, 231, 1108 and references therein.
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(1986)
Science (Washington, D. C.)
, vol.231
, pp. 1108
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Houk, K.1
Paddon-Row, M.N.2
Rondan, N.G.3
Wu, Y.D.4
Spellmeyer, D.C.5
Metz, J.T.6
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