X-ray Investigation of Ba2YCu3O6

Inorganic Chemistry

Volumn 27, Issue 5, 1988, Pages 871-873

  Garbauskas, M F ^a   Green, R W ^a   Arendt, R H ^a   Kasper, J S ^a  

^a GENERAL ELECTRIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33845279297     PISSN: 00201669     EISSN: 1520510X     Source Type: Journal    
DOI: 10.1021/ic00278a024     Document Type: Article

References (13)

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3. Sheldrick, G. M. “SHELXTL”; Nicolet Instrument Corp.: Madison, WI, 1983. Scattering factors from: International Tables for X-ray Crystallography; Kynoch: Birmingham, England, 1974; Vol. 4, pp 55-60.
4. Sheldrick, G. M. “SHELXTL”; Nicolet Instrument Corp.: Madison, WI, 1983. Scattering factors from: International Tables for X-ray Crystallography; Kynoch: Birmingham, England, 1974; Vol. 4, 99-101.
5. Sheldrick, G. M. “SHELXTL”; Nicolet Instrument Corp.: Madison, WI, 1983. Scattering factors from: International Tables for X-ray Crystallography; Kynoch: Birmingham, England, 1974; Vol. 4, 149-150.
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10. Schrott, A. G.; Park, S. I.; Tsuei, C. C., to be submitted for publication.
11. Jorgensen, J. D.; Beno, M. A.; Hinks, D. G.; Soderholm, K. J.; Volin, K. J.; Hitterman, R. L.; Grace, J. D.; Schuller, I. K.; Segre, C. U.; Zhang, K.; Kleefisch, M. S., submitted for publication in Phys. Rev.
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