The effect of white-noise mask level on sinewave contrast detection thresholds and the critical-band-masking model

Spanish Journal of Psychology

Volumn 9, Issue 2, 2006, Pages 249-262

  Serrano Pedraza, Ignacio ^a   Sierra Vázquez, Vicente ^b  

^a UNIVERSITY OF NEWCASTLE   (Australia)

^b UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Contrast detection threshold; Critical band masking paradigm; Spatial white noise

Indexed keywords

EID: 33845271214     PISSN: 11387416     EISSN: 19882904     Source Type: Journal    
DOI: 10.1017/S1138741600006156     Document Type: Conference Paper

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