-
1
-
-
0035170677
-
Requirement-based automated black-box test generation
-
Tahat, L., Vaysburg, B., Korel, B., Bader, A.: Requirement-based automated black-box test generation. In: IEEE COMPSAC. (2001) 489-495
-
(2001)
IEEE COMPSAC
, pp. 489-495
-
-
Tahat, L.1
Vaysburg, B.2
Korel, B.3
Bader, A.4
-
2
-
-
0348146011
-
-
Tech. Rep. IRO 1043, University of Montreal
-
Bourhfir, C., Dssouli, R., Aboulhamid, E.M.: Automatic test generation for EFSM-based systems. Tech. Rep. IRO 1043, University of Montreal (1996)
-
(1996)
Automatic Test Generation for EFSM-based Systems
-
-
Bourhfir, C.1
Dssouli, R.2
Aboulhamid, E.M.3
-
3
-
-
0036986570
-
Dependence analysis in reduction of requirement based test suites
-
Roma, Italy, ACM Press ISBN: 1-58113-562-9
-
Vaysburg, B., Tahat, L., Korel, B.: Dependence analysis in reduction of requirement based test suites. In: International Symposium on Software Testing and Analysis (ISSTA'02), Roma, Italy, ACM Press (2002) 107-111 ISBN: 1-58113-562-9.
-
(2002)
International Symposium on Software Testing and Analysis (ISSTA'02)
, pp. 107-111
-
-
Vaysburg, B.1
Tahat, L.2
Korel, B.3
-
4
-
-
0033880103
-
Test generation based on control and data dependencies within system specifications in sdl
-
Saleh, K., Ural, H., Williams, A.: Test generation based on control and data dependencies within system specifications in sdl. Computer Communications 23 (2000) 609-627
-
(2000)
Computer Communications
, vol.23
, pp. 609-627
-
-
Saleh, K.1
Ural, H.2
Williams, A.3
-
5
-
-
0026141382
-
A test sequence selection method for protocol testing
-
Ural, H., Yang, B.: A test sequence selection method for protocol testing. IEEE Transactions on Communications 39 (1991) 514-523
-
(1991)
IEEE Transactions on Communications
, vol.39
, pp. 514-523
-
-
Ural, H.1
Yang, B.2
-
6
-
-
0022043004
-
Selecting software test data using data flow information
-
Rapps, S., Weyuker, E.J.: Selecting software test data using data flow information. IEEE Trans. Software Eng. 11 (1985) 367-375
-
(1985)
IEEE Trans. Software Eng.
, vol.11
, pp. 367-375
-
-
Rapps, S.1
Weyuker, E.J.2
-
7
-
-
0024091830
-
An applicable family of data flow testing criteria
-
Frankl, P.G., Weyuker, E.J.: An applicable family of data flow testing criteria. IEEE Trans. Software Eng. 14 (1988) 1483-1498
-
(1988)
IEEE Trans. Software Eng.
, vol.14
, pp. 1483-1498
-
-
Frankl, P.G.1
Weyuker, E.J.2
-
8
-
-
0023385308
-
The program dependence graph and its use in optimization
-
Ferrante, K., Ottenstein, K., Warren, J.: The program dependence graph and its use in optimization. ACM Trans. Progr. Lang. & Systems 9 (1987) 319-349
-
(1987)
ACM Trans. Progr. Lang. & Systems
, vol.9
, pp. 319-349
-
-
Ferrante, K.1
Ottenstein, K.2
Warren, J.3
-
9
-
-
84941169088
-
-
TSR
-
Ural, H. et al.: TSR. http://www.site.uottawa.ca/~ural/TSR (2006)
-
(2006)
-
-
Ural, H.1
-
10
-
-
33845256321
-
-
University of Ottawa, Master Thesis in Computer Science
-
Chemli, O.: Reduced test suite generation. University of Ottawa, Master Thesis in Computer Science (2006)
-
(2006)
Reduced Test Suite Generation
-
-
Chemli, O.1
|