Interferometric characterization of stress birefringence in germanium

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3098, Issue , 1997, Pages 559-565

  Depuydt, Ben ^a   Boone, Pierre M ^a   Union, Piet ^b   Muys, Peter F ^b   Vyncke, Dirk ^c   Goessens, Claus ^c  

^a GHENT UNIVERSITY   (Belgium)

^b Radius Engineering NV   (Belgium)

^c Union Minière NV ^*  (Belgium)

Author keywords

birefringence; Germanium; mid infrared; phase measuring interferometry; stress

Indexed keywords

CZOCHRALSKI; ELECTRICAL RESISTIVITY; HIGH BIREFRINGENCE; INDEX HOMOGENEITY; INDEX OF REFRACTION; INTERFEROGRAMS; MIDINFRARED; PHASE-MEASURING INTERFEROMETRY; PRINCIPAL STRESS; STRESS BIREFRINGENCE; THERMAL IMAGING; TWYMAN-GREEN INTERFEROMETERS;

BIREFRINGENCE; DISKS (STRUCTURAL COMPONENTS); ELECTRIC CONDUCTIVITY; GERMANIUM; INFRARED DEVICES; INFRARED IMAGING; OPTICAL TESTING; REFRACTIVE INDEX; SAPPHIRE;

INTERFEROMETRY;

EID: 33845229950     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.281204     Document Type: Conference Paper

References (4)

1. I. De Ruijter, M. Van Sande, "Applications of Germanium, a review", presented at the Belgian Industrial Technology Seminars, Tokyo, April 22, 1993
2. J. Völkl, in "Handbook of Crystal Growth" 2b, Ed. D.T.J. Hurle, North-Holland (1994)
3. Landolt-Börnstein, New Series III 18, Springer Verlag (1984), p. 364
4. C. Hutchinson, C. Lewis, J. Savage, A. Pitt, "Surface and bulk absorption in germanium at 10.6 μm", Appl. Optics 21, 8 (1982)