Characterization of disorder in semiconductors via single-photon interferometry

Physical Review Letters

Volumn 97, Issue 22, 2006, Pages

  Bozsoki, P ^a   Thomas, P ^a   Kira, M ^a   Hoyer, W ^a   Meier, T ^a   Koch, S W ^a   Maschke, K ^b   Varga, I ^c   Stolz, H ^d  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

^b EPFL   (Switzerland)

^c INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^d UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; NUMERICAL METHODS; PHOTOEMISSION; PHOTONS; SEMICONDUCTOR MATERIALS;

ANGULAR CORRELATIONS; PHOTONIC CORRELATIONS; SPATIAL DISTRIBUTIONS;

NANOSTRUCTURED MATERIALS;

EID: 33845222960     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.227402     Document Type: Article

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