Transformation of electrical transport from variable range hopping to hard gap resistance in Zn1-xFexO1-v magnetic semiconductor films

Journal of Applied Physics

Volumn 100, Issue 10, 2006, Pages

  Tian, Y F ^a   Yan, Shi Shen ^a   Zhang, Y P ^a   Song, H Q ^a   Ji, G ^a   Liu, G L ^a   Chen, Y X ^a   Mei, L M ^a   Liu, J P ^b   Altuncevahir, B ^b   Chakka, V ^b  

^a SHANDONG UNIVERSITY   (China)

^b UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; ENERGY GAP; FERROMAGNETIC MATERIALS; MAGNETIC SEMICONDUCTORS; MAGNETORESISTANCE;

COULOMB INTERACTION; ELECTRICAL TRANSPORT; SEMICONDUCTOR FILMS;

MAGNETIC FILMS;

EID: 33845194656     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2386925     Document Type: Article

References (26)

1. N. F. Mott, J. Non-Cryst. Solids 1, 1 (1968).
2. A. L. Efros and B. I. Shklovskii, J. Phys. C 8, L49 (1975).
3. J.-J. Kim and H. J. Lee, Phys. Rev. Lett. 70, 2798 (1993).
4. I. Terry, T. Penney, S. von Molnár, and P. Becla, Phys. Rev. Lett. 69, 1800 (1992).
5. A. I. Yakimov, T. Wright, C. J. Adkins, and A. V. Dvurechenskii, Phys. Rev. B 51, 16549 (1995).
6. A. S. Ioselevich, Phys. Rev. Lett. 71, 1067 (1993).
7. P. Dai, Y. Zhang, and M. P. Sarachik, Phys. Rev. Lett. 69, 1804 (1992).
8. W. N. Shafarman, D. W. Koon, and T. G. Castner, Phys. Rev. B 40, 1216 (1989).
9. R. Oppermann and B. Rosenow, Phys. Rev. Lett. 80, 4767 (1998).
10. R. Chicon, M. Ortuo, and M. Pollak, Phys. Rev. B 37, 10520 (1988).
11. T. Sato, K. Ohashi, H. Sugai, T. Sumi, K. Haruna, H. Maeta, N. Matsumoto, and H. Otsuka, Phys. Rev. B 61, 12970 (2000).
12. A. N. Aleshin, A. N. Ionov, R. V. Parfen'ev, I. S. Shlimak, A. Heinrich, J. Schumann, and D. Elefant, Fiz. Tverd. Tela (Leningrad) 0367-3294 30, 696 (1988) A. N. Aleshin, A. N. Ionov, R. V. Parfen'ev, I. S. Shlimak, A. Heinrich, J. Schumann, and D. Elefant [Sov. Phys. Solid State 30, 398 (1988)].
13. A. N. Aleshin, A. N. Ionov, R. V. Parfen'ev, I. S. Shlimak, A. Heinrich, J. Schumann, and D. Elefant, Fiz. Tverd. Tela (Leningrad) 0367-3294 30, 696 (1988) A. N. Aleshin, A. N. Ionov, R. V. Parfen'ev, I. S. Shlimak, A. Heinrich, J. Schumann, and D. Elefant [Sov. Phys. Solid State 30, 398 (1988)].
14. Y. Meir, Europhys. Lett. 33, 471 (1996).
15. H. Kamimura, A. Kurobe, and T. Takemori, Physica B & C 117, 652 (1983).
16. I. Shlimak, S. I. Khondaker, M. Pepper, and D. A. Ritchie, Phys. Rev. B 61, 7253 (2000).
17. S. von Molnar, A. Briggs, J. Flouquet, and G. Remenyi, Phys. Rev. Lett. 51, 706 (1983).
18. A. Oiwa, Phys. Status Solidi B 205, 167 (1998).
19. P. Wagner, I. Gordon, L. Trappeniers, J. Vanacken, F. Herlach, V. V. Moshchalkov, and Y. Bruynseraede, Phys. Rev. Lett. 81, 3980 (1998).
20. M. Viret, L. Ranno, and J. M. D. Coey, Phys. Rev. B 55, 8067 (1997).
21. P. Xiong, B. L. Zink, S. I. Applebaum, F. Hellman, and R. C. Dynes, Phys. Rev. B 59, R3929 (1999).
22. S.-s. Yan, Appl. Phys. Lett. 84, 2376 (2004).
23. V. Ambegaokar, B. I. Halperin, and J. S. Langer, Phys. Rev. B 4, 2612 (1971).
24. J. Inoue and S. Maekawa, Phys. Rev. B 53, R11927 (1996).
25. S. Ju and Z.-Y. Li, J. Appl. Phys. 92, 5281 (2002).
26. T. Dietl, A. Haury, and Y. M. d'Aubigń, Phys. Rev. B 55, R3347 (1997).