Measurement of period of interference patterns with sub-micron period

Optics and Laser Technology

Volumn 39, Issue 5, 2007, Pages 918-921

  Srikanth, G ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

Interference; Measurement; Sub micron period

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; FIBER BRAGG GRATINGS; INTERFEROMETERS; MIRRORS; PRISMS;

INTERFERENCE FRINGES; INTERFERENCE PATTERNS; PHOTO WRITTEN BRAGG WAVELENGTHS; SUB MICRON PERIOD;

SIGNAL INTERFERENCE;

EID: 33845189511     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2006.07.002     Document Type: Article

References (4)

1. Kashyap R. Fiber Bragg gratings (1999), Academic Press, San Diego
2. Li C., Lu Y., Wu S., Su Q.-T., and Huang C.-W. Changing photo-written Bragg wavelengths of fiber gratings via one phase mask and four mirrors. Opt Laser Technol 36 (2004) 459-461
3. Rizvi N.H., and Gower M.C. Production of sub-micrometer period Bragg grating in optical fibers using wavefront division with a biprism and an excimer laser source. Appl Phys Lett 67 6 (1995)
4. Longhurst R.S. Geometrical and physical optics. 3rd ed (1986), Orient Longman, Hyderabad