Characterization of As-doped, p -type ZnO by x-ray absorption near-edge structure spectroscopy: Theory

Applied Physics Letters

Volumn 89, Issue 22, 2006, Pages

  Limpijumnong, Sukit ^a,b   Smith, M F ^a   Zhang, S B ^c  

^a National Synchrotron Research Center Thailand   (Thailand)

^b SURANAREE UNIVERSITY OF TECHNOLOGY   (Thailand)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; CRYSTAL DEFECTS; DOPING (ADDITIVES); MATHEMATICAL MODELS; SPECTROSCOPIC ANALYSIS; X RAY ANALYSIS; X RAY SCATTERING;

FIRST PRINCIPLES CALCULATIONS; X RAY ABSORPTION;

ZINC OXIDE;

EID: 33751581585     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2398895     Document Type: Article

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