Powder X-ray diffraction study of synthetic PdSn

Powder Diffraction

Volumn 21, Issue 4, 2006, Pages 307-309

  Laufek, František ^a,b   Vymazalová, Anna ^a   Plášil, Jakub ^b  

^a CZECH GEOLOGICAL SURVEY   (Czech Republic)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

PdSn; Powder diffraction data; Rietveld refinement

Indexed keywords

CRYSTALLOGRAPHIC DATA; PDSN; POWDER DIFFRACTION; POWDER X RAY DIFFRACTION; X-RAY POWDER; X-RAY SOURCES;

RIETVELD REFINEMENT;

X RAY DIFFRACTION;

EID: 33751576873     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2358360     Document Type: Article

References (8)

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