Robust contrast-invariant EigenDetection

Proceedings - International Conference on Pattern Recognition

Volumn 16, Issue 2, 2002, Pages 745-748

  Chennubhotla, Chakra ^a   Jepson, Allan ^a   Midgley, John ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; EIGENVALUES AND EIGENFUNCTIONS; IMAGE ANALYSIS; IMAGE PROCESSING; PARAMETER ESTIMATION; CLASSIFICATION (OF INFORMATION); MIXTURES; PROBABILITY DISTRIBUTIONS; STATISTICS;

DETECTION SCHEME; EIGEN DETECTION; OUTLIER DISTRIBUTION; PRINCIPAL SUBSPACE;

OBJECT RECOGNITION; PATTERN RECOGNITION;

APPEARANCE BASED; DETECTION SCHEME; OBJECT REPRESENTATIONS; ORTHOGONAL COMPLEMENTS; PRINCIPAL SUBSPACE; PROBABILISTIC MIXTURE MODELS; RESIDUAL SIGNALS; ROBUST ESTIMATION;

EID: 33751564230     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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