A novel approach for single view based plane metrology

Proceedings - International Conference on Pattern Recognition

Volumn 16, Issue 2, 2002, Pages 556-559

  Guanghui, Wang ^a   Yihong, Wu ^a   Zhanyi, Hu ^a  

^a INSTITUTE OF AUTOMATION   (China)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; IMAGING SYSTEMS; SPECIFICATIONS; UNITS OF MEASUREMENT;

HOMOGRAPHY; INDOOR ENVIRONMENTS; ORTHOGONAL LINES; PLANE METROLOGY;

MEASUREMENT THEORY; PATTERN RECOGNITION;

INDOOR ENVIRONMENT; NEW APPROACHES; ORTHOGONAL SETS; PARALLEL LINE; REAL APPLICATIONS; REAL IMAGES; SPACE CONTROL; VANISHING POINT;

EID: 33751563534     PISSN: 10514651     EISSN: None     Source Type: Journal    
DOI: 10.1109/ICPR.2002.1048364     Document Type: Article

References (9)

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