Full-information item bifactor analysis of graded response data

Applied Psychological Measurement

Volumn 31, Issue 1, 2007, Pages 4-19

  Gibbons, Robert D ^a   Bock, R Darrell ^a   Hedeker, Donald ^a   Weiss, David J ^b   Segawa, Eisuke ^a   Bhaumik, Dulal K ^a   Kupfer, David J ^c   Frank, Ellen ^c   Grochocinski, Victoria J ^c   Stover, Angela ^c  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

^c Western Psychiatric Institute   (United States)

Author keywords

Bi factor model; EM algorithm; Factor analysis; Item analysis; Maximum marginal likelihood; Ordinal data

Indexed keywords

EID: 33751549640     PISSN: 01466216     EISSN: 15523497     Source Type: Journal    
DOI: 10.1177/0146621606289485     Document Type: Article

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