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Physical Review Letters

Volumn 97, Issue 22, 2006, Pages

Fidelity and coherence measures from interference

(2) Oi, Daniel K L a Åberg, Johan a

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; POLARIZATION; TOMOGRAPHY; WAVE INTERFERENCE;

DIRECT PROCESS TOMOGRAPHY; PARTICLE INTERFERENCE; QUANTUM STATES;

QUANTUM THEORY;

EID: 33751541959 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.97.220404 Document Type: Article

Times cited : (18)

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