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Volumn 2005, Issue , 2005, Pages

Low power, high-speed radiation hardened computer & flight experiment

Author keywords

FPGA; H core; Microprocessor; Radiation tolerant; SEE; SEFI; SEU; TMR; TTMR

Indexed keywords

ON BOARD CHIPS; RADIATION TOLERANCE;

EID: 33751535808     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2005.1559559     Document Type: Conference Paper
Times cited : (10)

References (8)
  • 2
    • 0035162027 scopus 로고    scopus 로고
    • Total dose and single event effects testing of the intel pentium III(P3) and AMD K7 microprocessors
    • July
    • J. Howard and K. LaBel et al., "Total Dose and Single Event Effects Testing of the Intel Pentium III(P3) and AMD K7 Microprocessors," IEEE Radiation Effects Data Workshop, Pages: 38-47, July, 2001.
    • (2001) IEEE Radiation Effects Data Workshop , pp. 38-47
    • Howard, J.1    LaBel, K.2
  • 3
    • 0003133883 scopus 로고
    • Probabilistic logics and synthesis of reliable organisms from unreliable components
    • Princeton, NJ, Princeton University Press, September
    • J. V. Neumann., "Probabilistic logics and synthesis of reliable organisms from unreliable components," in Automata Studies, Princeton, NJ, Princeton University Press, 1958, Pages: 43-98, September, 1997.
    • (1958) Automata Studies , pp. 43-98
    • Neumann, J.V.1
  • 4
    • 4244047387 scopus 로고    scopus 로고
    • Ph.D Dissertation, Center for Reliable Computing, Stanford University, December
    • N. Oh, "Software Implemented Hardware Fault Tolerance," Ph.D Dissertation, Center for Reliable Computing, Stanford University, December, 2000.
    • (2000) Software Implemented Hardware Fault Tolerance
    • Oh, N.1
  • 6
    • 84879366424 scopus 로고    scopus 로고
    • Ultra low-power space computer leveraging embedded SEU mitigation
    • March 8-15
    • D. R. Czajkowski et al., "Ultra Low-Power Space Computer Leveraging Embedded SEU Mitigation," IEEE Aerospace Conference Proceedings, Vol.5, Pages: 2315-2328, March 8-15, 2003.
    • (2003) IEEE Aerospace Conference Proceedings , vol.5 , pp. 2315-2328
    • Czajkowski, D.R.1
  • 7
    • 0035723221 scopus 로고    scopus 로고
    • Single-event upset in the powerPC750 microprocessor
    • December
    • G. M. Swift et al., " Single-event upset in the PowerPC750 microprocessor," IEEE Transactions on Nuclear Science, Vol.48, Issue: 6, Pages: 1822-1827, December, 2001.
    • (2001) IEEE Transactions on Nuclear Science , vol.48 , Issue.6 , pp. 1822-1827
    • Swift, G.M.1
  • 8
    • 33751529619 scopus 로고    scopus 로고
    • SEFI mitigation technique for COTS microprocessors: Demonstration using proton irradiation experiments
    • September
    • M. P. Pagey et.al, "SEFI Mitigation Technique for COTS Microprocessors: Demonstration Using Proton Irradiation Experiments," 2004 Military Aerospace Programmable Logic Devices Conference, September, 2004.
    • (2004) 2004 Military Aerospace Programmable Logic Devices Conference
    • Pagey, M.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.