Development of a new total reflection X-ray fluorescence instrument using polycapillary X-ray lens

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 61, Issue 10-11 SPEC. ISS., 2006, Pages 1105-1109

  Nakano, K ^a,b   Tanaka, K ^a   Ding, X ^c   Tsuji, K ^a,b  

^a Osaka City University   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c BEIJING NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELEMENTARY PARTICLES; REFLECTION; SILICON; SUBSTRATES; X RAY ANALYSIS; X RAY SCATTERING;

POLYCAPILLARY X-RAY LENS; SINGLE PARTICLE; TOTAL REFLECTION X-RAY FLUORESCENCE (TRXF); X-RAY BEAM;

OPTICAL INSTRUMENT LENSES;

EID: 33751532688     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2006.07.007     Document Type: Article

References (11)

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