Development of a highly efficient and resistant robust design

International Journal of Production Research

Volumn 45, Issue 1, 2007, Pages 157-167

  Lee, Seong Beom ^a   Park, Chanseok ^b   Cho, Byung Rae ^c  

^a Inje University   (South Korea)

^b CLEMSON UNIVERSITY   (United States)

^c Clemson University   (United States)

Author keywords

Dual response; Efficiency; M Estimation; Optimization; Outlier; Resistance; Response surface; Robust design

Indexed keywords

DATA REDUCTION; DATA STRUCTURES; EFFICIENCY; FUNCTIONS; LEAST SQUARES APPROXIMATIONS; OPTIMIZATION; PROBLEM SOLVING; ROBUSTNESS (CONTROL SYSTEMS);

DUAL RESPONSE; M-ESTIMATION; RESPONSE SURFACES; ROBUST DESIGN;

PRODUCT DEVELOPMENT;

EID: 33751516380     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540600649202     Document Type: Article

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