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Volumn 1, Issue , 2005, Pages 197-200
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The PTAT sensors in CMOS technology
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Author keywords
PTAT; SEWING
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
INDUSTRIAL RESEARCH;
INTEGRATED CIRCUIT LAYOUT;
MICROPROCESSOR CHIPS;
POINT TO ABSOLUTE TEMPERATURE (PTAT);
TEST CHIPS;
SENSORS;
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EID: 33751515467
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SMICND.2005.1558746 Document Type: Conference Paper |
Times cited : (3)
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References (7)
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