Structural localization of trace amounts of impurity ions in Langmuir-Blodgett films by the X-ray standing wave method

Crystallography Reports

Volumn 51, Issue 6, 2006, Pages 1041-1047

  Novikova, N N ^a   Zheludeva, S I ^a   Stepina, N D ^a   Tolstikhina, A L ^a   Gainutdinov R V ^a   Erko, A I ^b   Haase, W ^c   Galyametdinov, Yu G ^d  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b HAHN MEITNER INSTITUT   (Germany)

^c Technical University   (Germany)

^d ZAVOISKY PHYSICAL TECHNICAL INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL IMPURITIES; CRYSTAL STRUCTURE; LIQUID CRYSTALS; MULTILAYERS; SYNCHROTRON RADIATION;

FILM DEPOSITION; LANGMUIR LAYERS; MOLECULAR FILM ORGANIZATION; ORGANIC LAYERS;

LANGMUIR BLODGETT FILMS;

EID: 33751504941     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063774506060150     Document Type: Article

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