Simulation of combined sources of intrinsic parameter fluctuations in a 'real' 35 nm MOSFET

Proceedings of ESSDERC 2005: 35th European Solid-State Device Research Conference

Volumn 2005, Issue , 2005, Pages 337-340

  Roy, Gareth ^a   Adamu Lema, Fikru ^a   Brown, Andrew R ^a   Roy, Scott ^a   Asenov, Asen ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DOPING (ADDITIVES); PARAMETER ESTIMATION; RANDOM PROCESSES; STATISTICAL METHODS;

DISCRETE RANDOM DOPANTS; INTRINSIC PARAMETER FLUCTUATIONS; SYSTEMATIC ANALYSIS;

MOSFET DEVICES;

EID: 33751433581     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDER.2005.1546654     Document Type: Conference Paper

References (7)

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