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Volumn 139, Issue 1-4, 2002, Pages 159-163

Quantitative WDXS microanalysis of bismuth-based BaBi4Ti4O15 perovskites doped with Nb and Fe

Author keywords

EPMA; Nb

Indexed keywords


EID: 33751429198     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s006040200055     Document Type: Article
Times cited : (6)

References (11)
  • 4
    • 0002017177 scopus 로고
    • In: K. F. J. Heinrich, D. E. Newbury (Eds.) Plenum Press, New York
    • J. L. Pouchou, F. Pichoir, Electron Probe Quantitation. In: K. F. J. Heinrich, D. E. Newbury (Eds.) Plenum Press, New York, 1991, p. 31.
    • (1991) Electron Probe Quantitation , pp. 31
    • Pouchou, J.L.1    Pichoir, F.2
  • 6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.