Effects of annealing on structural, optical and electrical properties of Al-doped ZnO thin films

Science in China, Series G: Physics Astronomy

Volumn 47, Issue 5, 2004, Pages 588-596

  Chen, Yanwei ^a,b   Yu, Wenhual ^a   Liu, Yichun ^a,b  

^a NORTHEAST NORMAL UNIVERSITY   (China)

^b CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

Electrical properties; Photoluminescence; Structural properties; Van der pauw measurement; ZnO: Al thin film

Indexed keywords

EID: 33751418152     PISSN: 16721799     EISSN: None     Source Type: Journal    
DOI: 10.1360/03yw0198     Document Type: Article

References (11)

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