65nm LP/GP Mix low cost platform for multi-media wireless and consumer applications

Proceedings of ESSDERC 2005: 35th European Solid-State Device Research Conference

Volumn 2005, Issue , 2005, Pages 423-426

  Tavel, B ^a   Duriez, B ^a   Gwoziecki, R ^d   Basso, M T ^b   Julien, C ^b   Ortolland, C ^a   Laplanche, Y ^b   Fox, R ^c   Sabouret, E ^b   Detcheverry, C ^a   Boeuf, F ^b   Morin, P ^b   Barge, D ^a   Bidaud, M ^a   Bienacel J ^b   Garnier, P ^a   Cooper, K ^c   Chapon, J D ^b   Trouiller, Y ^d   Belledent, J ^a   Broekaart, M ^a   Gouraud, P ^b   Denais, M ^b   Huard, V ^a   Rochereau, K ^a   Difrenza, R ^b   Planes, N ^b   Marin, M ^b   Boret, S ^b   Gloria, D ^b   Vanbergue, S ^a   Abramowitz, P ^c   Vishnubhotla, L ^c   Reber, D ^c   Stolk, P ^a   Woo, M ^c   Arnaud, F ^b   more..

^a NXP SEMICONDUCTORS   (Netherlands)

^b STMICROELECTRONICS   (France)

^c FREESCALE SEMICONDUCTOR INC   (United States)

^d DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

GATES (TRANSISTOR); MULTIMEDIA SYSTEMS; SPURIOUS SIGNAL NOISE; STATIC RANDOM ACCESS STORAGE; WIRELESS TELECOMMUNICATION SYSTEMS;

MOBILE PHONE DEMANDS; NMOS TRANSISTORS; RING OSCILLATORS;

CMOS INTEGRATED CIRCUITS;

EID: 33751417814     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDER.2005.1546675     Document Type: Conference Paper

References (7)

1. S.Zhao et al, Symposium on VLSI Tech., pp14-15, 2004
2. M.Togo et al, Symposium on VLSI Tech., pp88-89, 2004
3. S. Borkar et al, IEDM tech. Digest, pp 421-424, 2004
4. F.Arnaud et al, Symposium on VLSI Tech., pp10-11, 2004
5. T.Fukai et al, Symposium on VLSI Tech., pp83-84, 2003
6. B.Tavel et al, IEDM tech. Digest, pp643-646, 2003
7. B.Tavel et al.,ECS fall session: Dielectrics for Nanosystem, pp. 47-59, 2004