Solution-derived lithium manganese oxide thin films with silver additive and their characterization

Materials Chemistry and Physics

Volumn 101, Issue 1, 2007, Pages 217-220

  Wu, Xian Ming ^a   Chen, Shang ^a   He, Ze Qiang ^a   Ma, Ming You ^a   Xiao, Zhuo Bing ^a   Liu, Jian Ben ^a  

^a JISHOU UNIVERSITY   (China)

Author keywords

Annealing; Electrochemical properties; Electron microscopy; Thin films

Indexed keywords

ANNEALING; CURRENT DENSITY; DOPING (ADDITIVES); LITHIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CAPACITY RETENTION; CHARGE DISCHARGE CURRENT DENSITY; CYCLING BEHAVIOR; ELECTROCHEMICAL PROPERTIES;

THIN FILMS;

EID: 33751416371     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2006.03.009     Document Type: Article

References (15)

1. Bates J.B., Dudney N.J., Neudecker B., Ueda A., and Evans C.D. Solid State Ionics 135 (2000) 33-45
2. Kim H.K., Seong T.Y., and Yoon Y.S. Thin Solid Films 447-448 (2004) 619-625
3. Choi W.G., and Yoon S.G. J. Power Sources 125 (2004) 236-241
4. Liao C.L., Lee Y.H., Yu H.C., and Fung K.Z. Electrochim. Acta 50 (2004) 461-466
5. Rho Y.H., and Kanamura K. J. Electroanal. Chem. 559 (2003) 69-75
6. Wan C., Nuli Y., Zhuang J., and Jiang Z. Mater. Lett. 56 (2002) 357-363
7. Taniguchi I. Mater. Chem. Phys. 92 (2005) 172-179
8. Xu H.Y., Xie S., Zhang C.P., and Chen C.H. J. Power Sources 148 (2005) 90-94
9. Amriou T., Sayede A., Khelifa B., Mathieu C., and Aourag H. J. Power Sources 130 (2004) 213-220
10. Park H.Y., Lee S.R., Lee Y.J., Cho B.W., and Cho W.I. Mater. Chem. Phys. 93 (2005) 70-78
11. Maranchi J.P., Hepp A.F., and Kumta P.N. Mater. Sci. Eng. B 116 (2005) 327-340
12. Rho Y., Kanamura K., Fujisaki M., Hamagami J., Suda S., and Umegaki T. Solid State Ionics 151 (2002) 151-157
13. Yamada I., Abe T., Iriyama Y., and Ogumi Z. Electrochem. Commun. 5 (2003) 502-505
14. Julien C., Camacho-Lopez M.A., Escobar-Alarcon L., and Haro-Poniatowski E. Mater. Chem. Phys. 68 (2001) 210-216
15. Tao Y., Chen Z., Zhu B., and Huang W. Solid State Ionics 161 (2003) 187-192