On-line signature verification with two-stage statistical models

Proceedings of the International Conference on Document Analysis and Recognition, ICDAR

Volumn 2005, Issue , 2005, Pages 282-286

  Wan, Liang ^a   Wan, Bin ^b   Lin, Zhou Chen ^c  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c MICROSOFT RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SIGNATURE VERIFICATION; STATISTICAL MODELS; SYSTEM TUNING;

AUTOMATIC PROGRAMMING; MATHEMATICAL MODELS; PARAMETER ESTIMATION; STATISTICAL METHODS;

ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS;

EID: 33751412515     PISSN: 15205363     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDAR.2005.175     Document Type: Conference Paper

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