|
Volumn 569, Issue 3, 2006, Pages 890-893
|
Corrective optics for diffraction of γ-rays
|
Author keywords
ray spectrometers; Crystal diffraction; Segmented Ge detectors
|
Indexed keywords
CRYSTAL DEFECTS;
CRYSTALS;
DIFFRACTION;
GAMMA RAY SPECTROMETERS;
LIGHT EMISSION;
BENDING IMPERFECTIONS;
CRYSTAL DIFFRACTION;
SEGMENTED GE-DETECTORS;
GAMMA RAYS;
|
EID: 33751339317
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2006.08.131 Document Type: Article |
Times cited : (5)
|
References (12)
|