Likelihood ratio tests for PSK modulation classification in unknown noise environment

Canadian Conference on Electrical and Computer Engineering

Volumn 2005, Issue , 2005, Pages 151-154

  Tadaion, A A ^a,b   Derakhtian, M ^a   Gazor, S ^b   Aref, M R ^a  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

^b QUEEN S UNIVERSITY   (Canada)

Author keywords

Average likelihood ratio test; Maximum likelihood estimatioon; Modulation classification

Indexed keywords

ADDITIVE WHITE GAUSSIAN NOISE (AWGN); AVERAGE LIKELIHOOD RATIO TEST; GENERALIZED LIKELIHOOD RATIO TEST (GLRT); MODULATION CLASSIFICATION;

COMPUTATIONAL COMPLEXITY; GAUSSIAN NOISE (ELECTRONIC); MAXIMUM LIKELIHOOD ESTIMATION; PHASE MODULATION; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; WHITE NOISE;

PHASE SHIFT KEYING;

EID: 33751335083     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCECE.2005.1556898     Document Type: Conference Paper

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