Test results of various CMOS image sensor pixels

Canadian Conference on Electrical and Computer Engineering

Volumn 2005, Issue , 2005, Pages 2017-2020

  Li, David C Y ^a   Gaudet, Vincent C ^a   Basu, Anup ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

APS; CMOS image sensors; Photodiodes

Indexed keywords

APPROXIMATION THEORY; CMOS INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; ELECTRIC CURRENTS; PHOTODIODES; SOFTWARE PROTOTYPING; TRANSISTORS;

ACTIVE PIXEL SENSOR (APS); DIGITAL CAMERAS; PROTOTYPE CHIPS; TRANSISTOR PIXELS;

IMAGE SENSORS;

EID: 33751328574     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCECE.2005.1557381     Document Type: Conference Paper

References (3)

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2. C.-C. Wang, and C. G. Sodini, "The effect of hot carriers on the operation of CMOS active pixel sensors," IEEE IEDM Technical Digest, pp. 24.5.1-24.5.4, 2001.
3. S. M. Sze. Physics of semiconductor devices. John Wiley & Sons, 1981.