Algorithms for on-line monitoring of components in an optical tweezers-based assembly cell

Proceedings of the ASME Design Engineering Technical Conference

Volumn 2006, Issue , 2006, Pages

  Tao, Peng ^a   Balijepalli, Arvind ^a,b   Gupta, Satyandra K ^a   LeBrun, Thomas W ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CONDITION MONITORING; IMAGE ANALYSIS; ONLINE SYSTEMS;

ASSEMBLY CELLS; ASSEMBLY OPERATIONS; NANOMANIPULATION; OPTICAL TWEEZERS;

OPTICAL DEVICES;

EID: 33751312201     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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