The detection probability improvement of the far-side crack on the high lift-off using the magnetic camera

International Journal of Modern Physics B

Volumn 20, Issue 25-27, 2006, Pages 4631-4636

  Lee, Jinyi ^a   Hwang, Jiseong ^a  

^a Chosun University   (South Korea)

Author keywords

Far side crack; High lift off; Magnetic camera; Quantitative nondestructive evaluation

Indexed keywords

EID: 33751303747     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/s021797920604180x     Document Type: Conference Paper

References (4)

1. J. Lee, et., al., US patents, 6,683,452 B2 (2004).
2. J. Lee, D. Seo and T. Shoji, Key Eng. Mater., 270-273, 630 (2004).
3. J. Lee, J. Hwang, K. Lee and S. Choi, Key Eng. Mater., 306-308, 235 (2005).
4. J. Lee, J. Hwang, S. Choi and J. Lim, Key Eng. Mater., 306-308, 241 (2005).