Single Ca+ ion trapping toward precise frequency measurement of the 42S1/2-3 2D5/2 transition

Proceedings of the IEEE International Frequency Control Symposium and Exposition

Volumn 2005, Issue , 2005, Pages 616-622

  Matsubara, K ^a   Li, Y ^a   Kajita, M ^a   Hayasaka, K ^a   Hosokawa, M ^a   Urabe, S ^b  

^a NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM; ELECTRON TRANSITIONS; FREQUENCY METERS; FREQUENCY STANDARDS; SEMICONDUCTOR LASERS; UNCERTAIN SYSTEMS;

ELECTRIC QUADRUPOLE TRANSITION; ION TRAPPING; OPTICAL FREQUENCY STANDARD; RADIO FREQUENCY TRAP;

ELECTRON TRAPS;

EID: 33751282765     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FREQ.2005.1574005     Document Type: Conference Paper

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