Tandem analyzer crystals system doubles counting rate for Bonse-Hart ultra-small-angle neutron-scattering spectrometer

Physica B: Condensed Matter

Volumn 385-386, Issue , 2006, Pages 1190-1193

  Yamaguchi, Daisuke ^a   Koizumi, Satoshi ^a   Motokawa, Ryuhei ^a   Kumada, Takayuki ^a   Aizawa, Kazuya ^a   Hashimoto, Takeji ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Channel cut silicon perfect crystal; Double crystal diffractometer; Tandem; Ultra small angle neutron scattering (USANS)

Indexed keywords

CRYSTAL GROWTH; DIFFRACTOMETERS; NEUTRON SCATTERING; SPECTROMETERS; VECTORS;

CHANNEL-CUT SILICON PERFECT CRYSTALS; DOUBLE-CRYSTAL DIFFRACTOMETERS; TANDEM; ULTRA-SMALL-ANGLE NEUTRON SCATTERING (USANS);

CRYSTALLINE MATERIALS;

EID: 33751234816     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.05.405     Document Type: Article

References (4)

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4. Aizawa K., and Tomimitsu H. Physica B 213/214 (1995) 884