Influence of transversal magnetic field on negative ion extraction process in 3D computer simulation of the multi-aperture ion source

AIP Conference Proceedings

Volumn 812, Issue , 2006, Pages 153-156

  Turek, M ^a   Sielanko, J ^a   Franzen, P ^b   Speth, E ^b  

^a MARIA CURIE SK ODOWSKA UNIVERSITY   (Poland)

^b MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

Ion beam extraction; Ion sources; Plasma simulation

Indexed keywords

EID: 33751223506     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2168811     Document Type: Conference Paper

References (6)

1. A. Staebler, J.Sielanko, S.Goetz and E.Speth Fusion Technology 26(2), 145 (1994).
2. J.Sielanko and M. Muszyński, Electron Technology 30(4), 352 (1997).
3. C.K. Birdsall and A.B. Langdon, Plasma Physics via Computer Simulation, New York: MacGraw-Hill, 1985
4. R.Hockney and J.Eastwood, Computer Simulation Using Particles, Moscow: Mir, 1987.
5. O.Vollmer, B.Heinemann, W.Kraus, P.McNeely, R.Riedl, E.Speth, R.Trainham, R.Wilhem, Fusion Eng. and Des. 56-57, 485 (2001).
6. T. Sakurabayashi, A.Hatayama and M.Bacal, J. Appl. Phys 95, 3937 (2004).