-
1
-
-
0026135652
-
-
Boden, N.; Leng, S. A.; Ward, I. M. Solid State Ionics 1991, 45, 261.
-
(1991)
Solid State Ionics
, vol.45
, pp. 261
-
-
Boden, N.1
Leng, S.A.2
Ward, I.M.3
-
2
-
-
0002134424
-
-
Arumugam, S.; Shi, J.; Tunstall, D. P.; Vincent, C. A. J. Phys.: Condens. Matter 1993, 5, 153.
-
(1993)
J. Phys.: Condens. Matter
, vol.5
, pp. 153
-
-
Arumugam, S.1
Shi, J.2
Tunstall, D.P.3
Vincent, C.A.4
-
3
-
-
0020874235
-
-
Chadwick, A. V.; Strange, J. H.; Worboys, M. R. Solid State Ionics 1983, 9-10, 1155.
-
(1983)
Solid State Ionics
, vol.9-10
, pp. 1155
-
-
Chadwick, A.V.1
Strange, J.H.2
Worboys, M.R.3
-
5
-
-
0023451618
-
-
Fauteux, D.; Lupien, M. D.; Robitaille, C. D. J. Electrochem. Soc. 1987, 134, 2761.
-
(1987)
J. Electrochem. Soc.
, vol.134
, pp. 2761
-
-
Fauteux, D.1
Lupien, M.D.2
Robitaille, C.D.3
-
7
-
-
10044265267
-
-
Obeidi, Sh.; Zazoum, B.; Stolwijk, N. A. Solid State Ionics 2004, 173, 77.
-
(2004)
Solid State Ionics
, vol.173
, pp. 77
-
-
Obeidi, Sh.1
Zazoum, B.2
Stolwijk, N.A.3
-
8
-
-
30844455581
-
-
Obeidi, Sh.; Stolwijk, N. A.; Pas, S. J. Macromolecules 2005, 38, 10750.
-
(2005)
Macromolecules
, vol.38
, pp. 10750
-
-
Obeidi, Sh.1
Stolwijk, N.A.2
Pas, S.J.3
-
11
-
-
1442284691
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-
2 and 0.2 wt % CaO. These contaminai inns, which are inherent to the manufacturing process, are present in the form of small particles. See also, Suarez, S.; Abbrent, S.; Greenbaum, S. G.; Shin, J. H.; Passerini, S. Solid State Ionics 2004, 166, 407.
-
(2004)
Solid State Ionics
, vol.166
, pp. 407
-
-
Suarez, S.1
Abbrent, S.2
Greenbaum, S.G.3
Shin, J.H.4
Passerini, S.5
-
12
-
-
0000445799
-
-
Lonergan, M. C.; Shriver, D. F.; Ratner, M. A. Electrochim. Acta 1995, 40, 2041.
-
(1995)
Electrochim. Acta
, vol.40
, pp. 2041
-
-
Lonergan, M.C.1
Shriver, D.F.2
Ratner, M.A.3
-
13
-
-
19344372007
-
-
Voss, S.; Divinski, S.; Imre, A. W.; Mehrer, H.; Mundy, J. N. Solid State Ionics 2005, 176, 1383.
-
(2005)
Solid State Ionics
, vol.176
, pp. 1383
-
-
Voss, S.1
Divinski, S.2
Imre, A.W.3
Mehrer, H.4
Mundy, J.N.5
-
14
-
-
0020167545
-
-
Bonpunt, L.; Chanh, N. B.; Comberton, G.; Haget, Y.; Beniere, F. Radiat. Eff. 1983, 75, 33.
-
(1983)
Radiat. Eff.
, vol.75
, pp. 33
-
-
Bonpunt, L.1
Chanh, N.B.2
Comberton, G.3
Haget, Y.4
Beniere, F.5
-
17
-
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20344392881
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-
30NaI, the consideration of electrostatic interactions must go beyond the application of (extended) Debye - Hückel theory. See, for instance, Pai, S. J.; Bae, Y. C.; Sun, Y. K. J. Electrochem. Soc. 2005, 152, A864. In this first report on impurity diffusion in a polymer electrolyte system, we refrain from such a complex analysis, also because the pertaining activity coefficients may only be slightly different from unity and rather weakly dependent on temperature.
-
(2005)
J. Electrochem. Soc.
, vol.152
-
-
Pai, S.J.1
Bae, Y.C.2
Sun, Y.K.3
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18
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84906364195
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note
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19
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0036534783
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Furukawa, T.; Mukasa, Y.; Suzuki, T. Kano, K J. Polym. Sci., Part B 2002, 40, 613.
-
(2002)
J. Polym. Sci., Part B
, vol.40
, pp. 613
-
-
Furukawa, T.1
Mukasa, Y.2
Suzuki, T.3
Kano, K.4
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22944453384
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Dürr, O.; Dieterich, W.; Nitzan, A. J. Chem. Phys. 2004, 121, 12732.
-
(2004)
Chem. Phys.
, vol.121
, pp. 12732
-
-
Dürr, O.1
Dieterich, W.2
Nitzan, A.J.3
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84906392548
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note
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5,6 However, the differences are not significant within the pertaining experimental errors and statistical uncertainties.
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22
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84906407179
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note
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Rb in Figure 3 represents not only the "simple" fit to the Rb data alone (based on eq 12) but also the more elaborate fit involving both self-ion and Rb data (based on eqs 9-12). The minor differences between the two fitting curves are not visible in Figure 3.
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23
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84906407177
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note
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q, which have opposite curvatures in an Arrhenius plot (cf. Figure 6).
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24
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84906392547
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note
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0 ±100% corresponds to uncertainty factors of 2 (high bound) and 1/2 (low bound).
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