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Volumn 29, Issue 1, 2007, Pages 31-37

A spectral approach to estimate the INL of A/D converter

Author keywords

A D converter; A D converter testing; FFT testing; Fourier series; INL measurement

Indexed keywords

COMPUTER SIMULATION; CONTROL NONLINEARITIES; FAST FOURIER TRANSFORMS; METHOD OF MOMENTS; SPECTRUM ANALYSIS;

EID: 33751198701     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.csi.2005.12.004     Document Type: Article
Times cited : (13)

References (7)
  • 2
    • 0028446234 scopus 로고
    • Histogram measurement of ADC nonlinearities using sine waves
    • Blair J. Histogram measurement of ADC nonlinearities using sine waves. IEEE Trans. Instrum. Meas. 43 3 (June 1994) 373-383
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.3 , pp. 373-383
    • Blair, J.1
  • 3
    • 0036825668 scopus 로고    scopus 로고
    • FFT test of A/D converters to determine the integral nonlinearity
    • Adamo F., Attivissimo F., Giaquinto N., and Savino M. FFT test of A/D converters to determine the integral nonlinearity. IEEE Trans. Instrum. Meas. 51 5 (Oct. 2002) 1050-1054
    • (2002) IEEE Trans. Instrum. Meas. , vol.51 , Issue.5 , pp. 1050-1054
    • Adamo, F.1    Attivissimo, F.2    Giaquinto, N.3    Savino, M.4
  • 5
    • 0003659765 scopus 로고    scopus 로고
    • IEEE standard for terminology and test methods for analog-to-digital converters
    • IEEE standard for terminology and test methods for analog-to-digital converters. IEEE Std 1241-2000 (June 13 2001)
    • (2001) IEEE Std 1241-2000
  • 6
    • 33751186833 scopus 로고    scopus 로고
    • E. Kreyszig, Advanced Engineering Mathematics, Ed. Wiley, 7th Edition, 1993.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.