A spectral approach to estimate the INL of A/D converter

Computer Standards and Interfaces

Volumn 29, Issue 1, 2007, Pages 31-37

  Janik, Jean Marie ^a   Fresnaud, Vincent ^b  

^a ENSICAEN   (France)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

A D converter; A D converter testing; FFT testing; Fourier series; INL measurement

Indexed keywords

COMPUTER SIMULATION; CONTROL NONLINEARITIES; FAST FOURIER TRANSFORMS; METHOD OF MOMENTS; SPECTRUM ANALYSIS;

FOURIER SERIES; INTEGRAL NONLINEARITY (INL); INTEGRAL NONLINEARITY MEASUREMENT; SINE WAVES;

ANALOG TO DIGITAL CONVERSION;

EID: 33751198701     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.csi.2005.12.004     Document Type: Article

References (7)

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