Amorphous silicon thin film photodetectors with high sensitivity and selectivity in the ultraviolet spectrum

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2808, Issue , 1996, Pages 605-612

  Naletto, Giampiero ^a   Nicolosi, Piergiorgio ^a   Pace, Emanuele ^b   De Cesare, G ^c   Irrera, F ^c   Palma, F ^c  

^a UNIVERSITY OF PADOVA   (Italy)

^b UNIVERSITY OF FLORENCE   (Italy)

^c SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

amorphous silicon detector; photodetector; UV detector

Indexed keywords

AMORPHOUS SILICON THIN FILMS; ENHANCED EFFICIENCY; EXPERIMENTAL CONDITIONS; FLEXIBLE MATERIALS; HYDROGENATED AMORPHOUS SILICON (A-SI:H); RADIATION INTENSITY; THREE ORDERS OF MAGNITUDE; ULTRA-VIOLET SPECTRUMS;

AMORPHOUS SILICON; ASTRONOMY; GAMMA RAYS; GLOW DISCHARGES; PHOTODETECTORS; SILICON CARBIDE; ULTRAVIOLET DETECTORS; ULTRAVIOLET SPECTROSCOPY;

PHOTONS;

EID: 33751149851     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.256033     Document Type: Conference Paper

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