Forward Discrete Probability Propagation method for device performance characterization under process variations

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 1, Issue , 2005, Pages 220-223

  Topaloglu, Rasit Onur ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ELECTRIC RESISTANCE; MONTE CARLO METHODS;

DEVICE PERFORMANCE; MONTE CARLO TECHNIQUES; NOVEL TECHNIQUES; NUMBER OF SAMPLES; OUTPUT RESISTANCE; PROBABILITY PROPAGATION; PROCESS PARAMETERS; PROCESS VARIATION;

PROBABILITY DISTRIBUTIONS;

EID: 33751085762     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1120725.1120809     Document Type: Conference Paper

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