A novel embedded OTP NVM using standard foundry CMOS logic technology

21st IEEE Non-Volatile Semiconductor Memory Workshop 2006, NVSMW 2006

Volumn 2006, Issue , 2006, Pages 24-26

  Peng, J ^a   Rosendale, G ^a   Fliesler, M ^a   Fong, D ^a   Wang, J ^a   Ng, C ^a   Liu, Z S ^a   Luan, Harry ^a  

^a Kilopass Technology Inc   (United States)

Author keywords

Antifuse; Gate oxide breakdown; NVM; OTP

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA REDUCTION; EMBEDDED SYSTEMS; FORMAL LOGIC; PROGRAMMABLE LOGIC CONTROLLERS; RELIABILITY;

CMOS LOGIC TECHNOLOGY; NONVOLATILE MEMORY (NVM); ONE TIME PROGRAMMABLE (OTP); RELIABILITY DATA;

DATA STORAGE EQUIPMENT;

EID: 33751038075     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/.2006.1629479     Document Type: Conference Paper

References (7)

1. Peng, Jack, et al, US Patent #26,822,888
2. Peng, Jack, et al., US Patent #86,671,040
3. Candelier et al, US Patent #6,421,293
4. Smith, et al., U.S. Patent #6,525,955
5. Anthony, et al, U.S. Patent #6,580,144
6. Kilopass XPM Memory DS018 data sheet.
7. Kilopass XPM Memory Testing Methodology Guidelines