System test planning of software: An optimization approach

IEEE Transactions on Software Engineering

Volumn 32, Issue 7, 2006, Pages 503-509

  Chari, Kaushal ^b   Hevner, Alan ^a,b  

^a IEEE

^b UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

Nonlinear programming; Reliability; Test management

Indexed keywords

EXPONENTIAL RELIABILITY; SYSTEM TEST PLANNING; SYSTEM TESTING;

MATHEMATICAL MODELS; OPTIMIZATION; RELIABILITY THEORY; SOFTWARE TESTING;

COMPUTER SYSTEMS;

EID: 33751003106     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.2006.70     Document Type: Article

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