Improved test generation algorithms for pair-wise testing

Proceedings - International Symposium on Software Reliability Engineering, ISSRE

Volumn 2005, Issue , 2005, Pages 235-244

  Maity, Soumen ^a   Nayak, Amiya ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI   (India)

^b UNIVERSITY OF OTTAWA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; PARAMETER ESTIMATION; PROBLEM SOLVING; SET THEORY; SOFTWARE ENGINEERING;

INPUT PARAMETERS; PAIR WISE TESTING; SOFTWARE TESTING; TEST GENERATION ALGORITHMS;

COMPUTER TESTING;

EID: 33750966303     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSRE.2005.23     Document Type: Conference Paper

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