Uncertainty of wavelength limitation due to stylus tip radius for engineering surface texture based on wavelength and amplitude by FFT

Wear

Volumn 261, Issue 11-12, 2006, Pages 1225-1231

  Yoshida, Ichiro ^a   Tsukada, Tadao ^a  

^a MEIJI UNIVERSITY   (Japan)

Author keywords

Contact measurement; FFT; Stylus tip; Surface texture; Tip radius; Uncertainty

Indexed keywords

FAST FOURIER TRANSFORMS; GRAPH THEORY; MARKOV PROCESSES; PROBABILITY DENSITY FUNCTION;

CONTACT MEASUREMENTS; STYLUS TIP; SURFACE TEXTURES; TIP RADIUS;

SURFACE ROUGHNESS;

FAST FOURIER TRANSFORMS; GRAPH THEORY; MARKOV PROCESSES; PROBABILITY DENSITY FUNCTION; SURFACE ROUGHNESS;

EID: 33750960456     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2006.03.006     Document Type: Article

References (11)

1. ISO 3274:1996, GPS-Surface texture: Profile method; Nominal characteristics of contact (stylus) instruments.
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3. Whitehouse D.J. Fractal or fiction. Wear 249 (2001) 345-353
4. ISO 5436-1:2000, GPS-Surface texture: Profile method; Measurement standards-Part 1: Material measures.
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8. ISO 4288:1996, GPS-Surface texture: Profile method; Rules and procedures for the assessment of surface texture.
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