The relation between the ROC curve and the CMC

Proceedings - Fourth IEEE Workshop on Automatic Identification Advanced Technologies, AUTO ID 2005

Volumn 2005, Issue , 2005, Pages 15-20

  Bolle, R M ^a   Connell, J H ^a   Pankanti, S ^a   Ratha, N K ^a   Senior, A W ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CUMULATIVE MATCH CURVE (CMC); FALSE ACCEPT RATE (FAR); FALSE REJECT RATE (FRR); RECEIVER OPERATING CHARACTERISTIC CURVE (ROC CURVE);

COMPUTATIONAL METHODS; DATA PROCESSING; INFORMATION ANALYSIS; PATTERN MATCHING; PATTERN RECOGNITION SYSTEMS;

ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS;

EID: 33750948043     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTOID.2005.48     Document Type: Conference Paper

References (4)

1. R. Bolle, J. Connell, S. Pankanti, N. Ratha, and A. Senior. Guide to Biometrics. Springer, New York, 2004.
2. P. Grother and P. Philips. Models of large population recognition performance. In Proc. CVPR, volume 2, pages 68-75, 2004.
3. P. Phillips, P. Grother, R. Micheals, D. Blackburn, T. Elham, and J. M. Bone. FRVT 2002: Facial recognition vendor test. Technical report, DoD, Apr. 2003.
4. P. Phillips, H. Moon, S. Rizvi, and P. Rauss. The FERET evaluation methodology for face-recognition algorithms. IEEE PAMI, 22(10):1090-1104, Oct. 2000.