Multiscale evaluation of microstructural worthiness based on the physical-analytical matching (PAM) approach

Theoretical and Applied Fracture Mechanics

Volumn 46, Issue 3, 2006, Pages 243-261

  Sih, G C ^a,b  

^a EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b Lehigh University   (United States)

Author keywords

Closed and open crack; Cracking patterns; Equivalent line crack; Essential parameters; Global and local; Incidental variables; Inhomogeneity; Matching analysis with physics; Maximum stress; Micro macro interaction; Microstructural effect; Mutliscaling; Size and time; Volume energy density

Indexed keywords

COMPUTER NETWORKS; DIGITAL SIGNAL PROCESSING; MATHEMATICAL MODELS; MICROSTRUCTURE; PROBABILITY DENSITY FUNCTION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

CRACKING PATTERNS; INCIDENTAL VARIABLES; MICRO/MACRO LINE CRACKING MODEL; MULTISCALING; PHYSICAL-ANALYTICAL MATCHING (PAM) APPROACH;

MICROCRACKING;

COMPUTER NETWORKS; DIGITAL SIGNAL PROCESSING; MATHEMATICAL MODELS; MICROCRACKING; MICROSTRUCTURE; PROBABILITY DENSITY FUNCTION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33750942987     PISSN: 01678442     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tafmec.2006.09.003     Document Type: Article

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