Statistical modeling of cross-coupling effects in VLSI interconnects

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 1, Issue , 2005, Pages 503-506

  Agarwal, Mridul ^a   Agarwal, Kanak ^b   Sylvester, Dennis ^b   Blaauw, David ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; INTELLIGENT SYSTEMS; MONTE CARLO METHODS; VLSI CIRCUITS;

CROSS-COUPLINGS; CROSSTALK NOISE; MEAN AND STANDARD DEVIATIONS; PHYSICAL DIMENSIONS; PROCESS VARIATION; RC INTERCONNECTS; STATISTICAL MODELING; VLSI INTERCONNECTS;

INTEGRATED CIRCUIT INTERCONNECTS;

EID: 33750908758     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1120725.1120922     Document Type: Conference Paper

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