Object recognition using appearance models accumulated into environment

Proceedings-International Conference on Pattern Recognition

Volumn 15, Issue 4, 2000, Pages 845-848

  Yasushi, M A E ^a   Umetani, Tomohiro ^a   Arai, Tatsuo ^a   Inoue, Kenji ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

OBJECT RECOGNITION; RADIO FREQUENCY IDENTIFICATION (RFID); ROBOTS;

APPEARANCE MODELS; EIGEN SPACE ANALYSIS; EIGENSPACES;

PATTERN RECOGNITION SYSTEMS;

EID: 33750903127     PISSN: 10514651     EISSN: None     Source Type: Journal    
DOI: 10.1109/ICPR.2000.903049     Document Type: Article

References (6)

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