Yoffe-type moving crack in a functionally graded piezoelectric material

Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 458, Issue 2018, 2002, Pages 381-399

  Li, Chunyu ^a   Weng, G J ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

Dynamic fracture; Functionally graded piezoelectric materials; Moving crack; Piezoelectricity; Stress and electric field intensity factors

Indexed keywords

EID: 33750901031     PISSN: 13645021     EISSN: None     Source Type: Journal    
DOI: 10.1098/rspa.2001.0873     Document Type: Article

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