TEM study of Mn-doped ZnO thin films synthesized by PLD

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 976-977

  Li, X Z ^a   Zhang, Jun ^a   Sellmyer, D J ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750882232     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606061502     Document Type: Conference Paper

References (6)

1. T. Dietl, H. Ohno, F. Matsukura, J. Cibert, and D. Ferrand, Science 287 (2000) 1019.
2. K. Sato, and H. Katayama-Yoshida, Jpn. J. Appl. Phys., Part 2 39 (2000) L555.
3. D. Kundaliya, S. Ogale, S. Lofland, S. Dhar, C. Metting, S. Shinde, Z. Ma, B. Varughese, K. Ramanujachary, L. Salamanca-Riba, and T. Venkatesan, Nature Mater. 3 (2004) 709.
4. Jun Zhang, R. Skomski, and D. J. Sellmyer, J. Appl. Phys. 97 (2005) 10D303.
5. Y. W. Heo, M. P. Ivill, K. Ip, D. P. Norton, S. J. Pearton, J. G. Kelly, R. Rairigh, A. F. Hebard, and T. Steiner, Appl. Phys. Lett. 84 (2004) 2292.
6. This work was supported by NSF-MRSEC, W. M. Keck Foundation, NRI and CMRA.